Automatic Generation\nof Contrast Maps in Terms of\nvan der Waals Material Properties in Bimodal AFM

van der Waals (vdW) forces are of interest in colloid\nscience,\nbiophysics, cell biology, and the field of vdW heterostructures. We\npresent a model and method to quantify vdW material properties of\nsamples routinely in standard bimodal atomic force microscopy (AFM)\nwithout the need to establish mechanical contact with the samples.\nThe method preserves the high resolution of bimodal AFM but enhances\ncontrast by exploiting several transforms that lead to the production\nof contrast maps in the form of vdW material properties, i.e., Hamaker\nconstant, adhesion, surface energy, peak forces, and surface energy\nhysteresis. We show that some of these maps provide information that\nis otherwise concealed in the raw channels.