Toward Understanding\nthe Current Drift Using Pulsed\nVoltage for a Stable Perovskite X‑ray Detector

Metal halide perovskite single crystals\n(SCs) have demonstrated\nsignificant potential for X-ray detection. However, the current drift\nof perovskite detectors has been the primary obstacle for commercialization.\nHere, we investigate the current drift of perovskite devices using\nthe pulsed voltage (PV) method and establish stable PV radiation detectors\nbased on MAPbBr<sub>3</sub> SC. The trend of current drift is identified\nto be dependent on waiting time with the negligible disturbance of\ncarriers in PV measurements, which is influenced by the competition\neffect between ionic polarization and defect proliferation. Furthermore,\nan aluminum-bathocuproine (Al-BCP) chelating electrode is used to\nshorten the waiting time, which is vital for the practicability of\nX-ray detectors based on the PV method. The synergistic effect of\nthe PV method and chelating interface in MAPbBr<sub>3</sub> SC detectors\nexhibits double records under 100 V, including a sensitivity of 1.13\n× 10<sup>5</sup> μC Gy<sub>air</sub><sup>–1</sup> cm<sup>–2</sup> and a detection limit of 0.7 nGy<sub>air</sub> s<sup>–1</sup>. The photon-generated carriers under continuous\nillumination fill defects, resulting in an obvious photoconductive\ngain generation. This work enhances further understanding of current\ndrift in perovskite devices and shows the tremendous application potential\nof perovskite X-ray detectors.