Significantly overestimated mobility and other inconsistencies in A. Liu et al., Nature 629, 798 (2024)
This preprint provides a critical analysis of the thin-film transistor (TFT) characteristics published in A. Liu et al., "Selenium-alloyed tellurium oxide for amorphous p-channel transistors", Nature 629, 798 (2024), revealing significant inconsistencies within the published data set, in which (parts of) the data contradict to the claimed TFT mobility, thus showing that the reported mobility appears to be significantly overestimated.
Institutions
- Rutgers, The State University of New Jersey (US)
- Rutgers Sexual and Reproductive Health and Rights (NL)
Publication Details
- Journal
- Zenodo (CERN European Organization for Nuclear Research)
- Published
- 2024-12-31
- DOI
- https://doi.org/10.5281/zenodo.14583687
- Primary Topic
- Thin-Film Transistor Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.00