PHYSICO-CHEMICAL AND X-RAY DIFRACTION INVESTIGATION OF SOLID SO-LUTIONS (PbS)1-x(YbGa2S4)x
Abstract To determine the region of solid solutions (PbS)1-x(YbGa2S4)x (x=0.01; 0.02; 0.03) complex methods of physicochemical analysis were used: differential thermal analysis (DTA), X-ray phase analysis (XRD), microstructural analysis (MSA), as well as measuring microhardness and density. The nature of interaction between PbSe and YbGa2S4 was studied, it was found that introduction of YbGa2S4 into PbS leads to formation of solid solutions and change of some physicochemical properties. It was found that solid solutions based on PbSe at room temperature reach 3% YbGa2S4. For alloys of solid solution (PbS)1-x(YbGa2S4)x (x = 0.01; 0.02; 0.03) 2 and 3 mol. % YbGa2S4 the X-ray diffraction data were studied and lattice parameters were calculated. It was established that the obtained alloys crystallize with cubic syngony with lattice parameters: a= 6.03 and a=6.10 Å, respectively
Publication Details
- Journal
- Zenodo (CERN European Organization for Nuclear Research)
- Published
- 2024-11-12
- DOI
- https://doi.org/10.5281/zenodo.14169104
- Primary Topic
- Chalcogenide Semiconductor Thin Films
- Type
- article
- Field-Weighted Citation Impact
- 0.00