Structural, Surface Morphological, and Optical Properties of Pulsed Laser Deposited MoS2/ZnO Microrods for Optoelectronic Applications

In the present work, hexagonal MoS2/ZnO thin film was synthesized via pulsed laser deposition method. We studied the structural and optical properties of MoS2/ZnO thin film deposited on Si (100) substrate at room temperature using a Nd:YAG laser (248 nm, 10 ns pulse duration and 10 Hz repetition rate). FESEM images demonstrated a flower-like topography of MoS2/ZnO with the well-defined hexagonal microrods and flat top surface. The band gap was determined from the analysis of UV-Visible spectrum and found to be 2.90 eV for MoS2/ZnO microrods and 3.12 eV for pure ZnO. The hexagonal wurtzite crystal structure of MoS2/ZnO composite thin film was confirmed by XRD pattern. Raman spectrum of MoS2/ZnO microrods showed two characteristics peaks at 379 and 403 corresponding to and modes, respectively. Enhancement of the near-band-edge ultraviolet emission was achieved by deposition of MoS2 on the surface of ZnO microrods. The Ossila four-point probe device measured the DC electrical conductivity. The results indicate that MoS2/ZnO microrods are regarded as promising prospects for the future of optoelectronic applications.