Summary of IC Ct value results from samples which failed IC threshold test multiple times. (i) Initial testing, (r) repeat testing.

Summary of IC Ct value results from samples which failed IC threshold test multiple times. (i) Initial testing, (r) repeat testing.

Publication Details

Journal
Figshare
Published
2025-02-06
DOI
https://doi.org/10.1371/journal.pone.0316700.s005
Primary Topic
VLSI and Analog Circuit Testing
Type
article
Field-Weighted Citation Impact
0.00
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article

Summary of IC Ct value results from samples which failed IC threshold test multiple times. (i) Initial testing, (r) repeat testing.

Figshare
VLSI and Analog Circuit Testing
article

Summary of IC Ct value results from samples which failed IC threshold test multiple times. (i) Initial testing, (r) repeat testing.

article en

Abstract

Summary of IC Ct value results from samples which failed IC threshold test multiple times. (i) Initial testing, (r) repeat testing.

Figshare
Openalex Percentile: Top 52%
VLSI and Analog Circuit Testing
DOISourceOpenAlex
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Summary of IC Ct value results from samples which failed IC threshold test multiple times. (i) Initial testing, (r) repeat testing. · Figshare (2025) | TGRS Research Map | TGRS