Descriptions and analyses of valence ratings can be found in the Supplementary materials (SM).

Publication Details

Journal
Figshare
Published
2024-09-18
DOI
https://doi.org/10.1371/journal.pone.0310168.s001
Primary Topic
X-ray Diffraction in Crystallography
Type
article
Field-Weighted Citation Impact
0.00
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article

Descriptions and analyses of valence ratings can be found in the Supplementary materials (SM).

Figshare
X-ray Diffraction in Crystallography
article

Descriptions and analyses of valence ratings can be found in the Supplementary materials (SM).

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Abstract

No abstract available for this paper.
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Openalex Percentile: Top 78%
X-ray Diffraction in Crystallography
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Descriptions and analyses of valence ratings can be found in the Supplementary materials (SM). · Figshare (2024) | TGRS Research Map | TGRS