Structural and optical characterization of hole-doped Ge/SiGe multiple quantum wells for mid-infrared photonics

\nThe structural and optical properties of p-doped Ge quantum wells separated by SiGe barriers are presented. The composition profile was determined by atom probe tomography and X-ray diffraction measurements. The energy and broadening of the fundamental intersubband transition were studied by Fourier transform infrared spectroscopy which revealed a strong absorption peak around 8.5 μm making this or similar heterostructures suitable for the realization of optoelectronic devices working in the fingerprint region.\n

Publication Details

Journal
Springer Link (Chiba Institute of Technology)
Published
2024-10-31
DOI
https://doi.org/10.1051/epjconf/202430901012/pdf
Primary Topic
Advanced Materials Characterization Techniques
Type
article
Field-Weighted Citation Impact
0.00

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article

Structural and optical characterization of hole-doped Ge/SiGe multiple quantum wells for mid-infrared photonics

Springer Link (Chiba Institute of Technology)
Advanced Materials Characterization Techniques
article

Structural and optical characterization of hole-doped Ge/SiGe multiple quantum wells for mid-infrared photonics

article en

Abstract

\nThe structural and optical properties of p-doped Ge quantum wells separated by SiGe barriers are presented. The composition profile was determined by atom probe tomography and X-ray diffraction measurements. The energy and broadening of the fundamental intersubband transition were studied by Fourier transform infrared spectroscopy which revealed a strong absorption peak around 8.5 μm making this or similar heterostructures suitable for the realization of optoelectronic devices working in the fingerprint region.\n

Springer Link (Chiba Institute of Technology)
European Commission
Openalex Percentile: Top 71%
Advanced Materials Characterization Techniques
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Structural and optical characterization of hole-doped Ge/SiGe multiple quantum wells for mid-infrared photonics · Springer Link (Chiba Institute of Technology) (2024) | TGRS Research Map | TGRS