The Devil Is in the\nDetails: Pitfalls and Ambiguities\nin the Analysis of X‑ray Powder Diffraction Data of 2D Covalent\nOrganic Frameworks

X-ray powder diffraction (XRPD) data of covalent organic\nframeworks\n(COFs) seem to be simple and apparently do not contain a lot of structural\ninformation, as these patterns usually do not show more than 3–5\ndistinguishable Bragg peaks. As COFs are inherently complex materials\n exhibiting a variety of disorder phenomena like stacking faults,\nlayer curving, or disordered solvent molecules populating the pores,\nthe interpretation of XRPD patterns is far from being trivial. Here\nwe emphasize the critical need for precision and caution in XRPD data\nacquisition, refinement, and interpretation to avoid common pitfalls\nand overinterpretations in data analysis. This perspective serves\nas a comprehensive guide, educating the community on the nuances of\nrefinement processes necessary for advancing COF research with clarity\nand accuracy.