Atomic-Scale\nCharacterization of 180° Conductive\nDomain Walls in PbZr<sub>0.1</sub>Ti<sub>0.9</sub>O<sub>3</sub>

Conductive domain\nwalls (DWs) in ferroic materials have emerged\nas promising candidates for applications in nanoelectronics due to\ntheir unique properties such as high conductivity and nonvolatility.\nIn this study, we investigate the atomic structure and conductivity\nof nominally neutral 180° DWs artificially created in an epitaxial\nthin film of tetragonal PbZr<sub>0.1</sub>Ti<sub>0.9</sub>O<sub>3</sub>. Using piezoresponse force microscopy and scanning transmission\nelectron microscopy, we elucidate the complex structure of these 180°\nDWs and their coupling with ferroelastic domains, revealing that they\nexhibit a complex structure due to the strain-mediated interplay with\nthe ferroelastic domains. Our results demonstrate that the 180°\nDWs conductivity is associated with the emergence of polar discontinuities,\nincluding the formation of tail-to-tail charged segments, which has\nbeen further confirmed by electron energy loss spectroscopy. Additionally,\nwe investigated the long-term performance of these domain boundaries,\ndemonstrating their unique mobility and structural stability. Our\nfindings provide insights into the atomic-scale mechanisms that turn\nnominally neutral DWs into highly conductive channels, paving the\nway for their use in advanced nanoelectronic devices.