Supplemental Material
Details of the X-ray reflectivity patterns and XRD of a-LaAlO3 and TiO2 thin films, in-plane magnetoresistance for S10, and temperature dependence of phase coherence length.
Publication Details
- Journal
- AIP Publishing
- Published
- 2025-02-19
- DOI
- https://doi.org/10.60893/figshare.apl.28369133
- Primary Topic
- Magnetic and transport properties of perovskites and related materials
- Type
- article
- Field-Weighted Citation Impact
- 0.00