Study on embedded system for voltage and current measurement using microcontroller and sensors

AbstractMicrocontroller is widely used in different sophisticated instruments as they are highly reliable and easily programmable as per our need .Real time monitoring of voltage and current has very wide range of applications. In this paper an experimental system based on Atmega 2560 microcontroller was developed. The main components of the system were Atmega 2560 microcontroller, voltage sensor and current sensor. In this paper data acquisition process between microcontroller and computer is also introduced. The method used for transferring data is serial communication. Keywords: Microcontroller, Voltage sensor, Sensor interface

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Publication Details

Journal
Zenodo (CERN European Organization for Nuclear Research)
Published
2024-12-24
DOI
https://doi.org/10.5281/zenodo.15114627
Primary Topic
Microwave Imaging and Scattering Analysis
Type
article
Field-Weighted Citation Impact
0.00
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article

Study on embedded system for voltage and current measurement using microcontroller and sensors

Zenodo (CERN European Organization for Nuclear Research)
Microwave Imaging and Scattering Analysis
article

Study on embedded system for voltage and current measurement using microcontroller and sensors

article en

Abstract

AbstractMicrocontroller is widely used in different sophisticated instruments as they are highly reliable and easily programmable as per our need .Real time monitoring of voltage and current has very wide range of applications. In this paper an experimental system based on Atmega 2560 microcontroller was developed. The main components of the system were Atmega 2560 microcontroller, voltage sensor and current sensor. In this paper data acquisition process between microcontroller and computer is also introduced. The method used for transferring data is serial communication. Keywords: Microcontroller, Voltage sensor, Sensor interface

Zenodo (CERN European Organization for Nuclear Research)
Veer Narmad South Gujarat University (IN), Department of Commerce (AU)
Openalex Percentile: Top 72%
Microwave Imaging and Scattering Analysis
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