Generational Development of Combinational Circuits

An overview of the state of the research on combinational circuit dependability is given in this article. The developed techniques for creating combinational circuits and how they were later implemented as software are explained. Combinational circuits in the structured Verilog format were created using the developed techniques, and the Nangate open standard cell library was utilized to transform the circuits into circuits. Scheme parameters were computed and saved in an organized manner so they could later be transformed into a CSV dataset. The program that was built was utilized to create a dataset of combinational circuits. This dataset can be utilized for research purposes to estimate the dependability of combinational circuits with limited information. Two machines were used to test the created dataset.

Publication Details

Journal
Zenodo (CERN European Organization for Nuclear Research)
Published
2024-09-09
DOI
https://doi.org/10.5281/zenodo.13734118
Primary Topic
Radiation Effects in Electronics
Type
article
Field-Weighted Citation Impact
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article

Generational Development of Combinational Circuits

Zenodo (CERN European Organization for Nuclear Research)
Radiation Effects in Electronics
article

Generational Development of Combinational Circuits

article en

Abstract

An overview of the state of the research on combinational circuit dependability is given in this article. The developed techniques for creating combinational circuits and how they were later implemented as software are explained. Combinational circuits in the structured Verilog format were created using the developed techniques, and the Nangate open standard cell library was utilized to transform the circuits into circuits. Scheme parameters were computed and saved in an organized manner so they could later be transformed into a CSV dataset. The program that was built was utilized to create a dataset of combinational circuits. This dataset can be utilized for research purposes to estimate the dependability of combinational circuits with limited information. Two machines were used to test the created dataset.

Zenodo (CERN European Organization for Nuclear Research)
Openalex Percentile: Top 70%
Radiation Effects in Electronics
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