Analysis of noise characteristics in intraoral X-Ray sensors using the Noise-Power spectrum and nonparametric metrics from diagnostic imaging.

Digital X-ray sensors have significantly changed dental radiography, enabling faster image acquisition and reducing radiation doses for patients. Despite the advancements in technology, noise in X-ray imaging remains a challenge. In this study, noise was examined using the Noise Power Spectrum (NPS) and a nonparametric method. Blank images were taken under different exposure times and voltage settings. The analyses show that noise decreases with longer exposure times. Among the examined sensors, two showed distinct NPS peaks, and one exhibited no relationship between exposure time and noise levels. These results are discussed on terms of specific sensor structures, artifacts and/or unaccessible post-processing algorithms.