RD53 pixel readout integrated circuits for ATLAS and CMS HL-LHC upgrades

The RD53 collaboration has since 2013 developed new hybrid pixel detector chips with 50 × 50 μm$^2$ pixels for the HL-LHC upgrades of the ATLAS and CMS experiments at CERN. A common architecture, design and verification framework has been developed to enable final pixel chips of different sizes to be designed, verified and tested to handle extreme hit rates of 3 GHz/cm$^2$ (up to 12 GHz per chip) together with an increased trigger rate of 1 MHz and efficient readout of up to 5.12 Gbits/s per pixel chip. Tolerance to an extremely hostile radiation environment with 1 Grad over 10 years and induced SEU (Single Event Upset) rates of up to 100 upsets per second per chip have been major challenges to make reliable pixel chips. Three generations of pixel chips, and many specific mixed signal building blocks and radiation test chips, have been submitted and extensively tested to get to final production chips. The large, complex and high rate pixel chips have been developed with a strong emphasis on low power consumption together with a concurrent development and qualification of novel serial powering at chip, module and system level, to minimize detector material budget.

Publication Details

Journal
Repository for Publications and Research Data (ETH Zurich)
Published
2025-03-01
DOI
https://doi.org/10.3929/ethz-b-000729450
Primary Topic
Particle Detector Development and Performance
Type
article
Field-Weighted Citation Impact
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article

RD53 pixel readout integrated circuits for ATLAS and CMS HL-LHC upgrades

Repository for Publications and Research Data (ETH Zurich)
Particle Detector Development and Performance
article

RD53 pixel readout integrated circuits for ATLAS and CMS HL-LHC upgrades

article en

Abstract

The RD53 collaboration has since 2013 developed new hybrid pixel detector chips with 50 × 50 μm$^2$ pixels for the HL-LHC upgrades of the ATLAS and CMS experiments at CERN. A common architecture, design and verification framework has been developed to enable final pixel chips of different sizes to be designed, verified and tested to handle extreme hit rates of 3 GHz/cm$^2$ (up to 12 GHz per chip) together with an increased trigger rate of 1 MHz and efficient readout of up to 5.12 Gbits/s per pixel chip. Tolerance to an extremely hostile radiation environment with 1 Grad over 10 years and induced SEU (Single Event Upset) rates of up to 100 upsets per second per chip have been major challenges to make reliable pixel chips. Three generations of pixel chips, and many specific mixed signal building blocks and radiation test chips, have been submitted and extensively tested to get to final production chips. The large, complex and high rate pixel chips have been developed with a strong emphasis on low power consumption together with a concurrent development and qualification of novel serial powering at chip, module and system level, to minimize detector material budget.

Repository for Publications and Research Data (ETH Zurich)
Openalex Percentile: Top 80%
Particle Detector Development and Performance
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