DifFault: Simulation of diffraction patterns of faulted crystals

We have developed a software library called DifFault to generate X-ray diffraction (XRD) patterns of cubic structures. The simulation of the XRD peak profiles in the patterns is based on physical principles and accounts for the effects of crystallite size, dislocations, and planar faults. The program is able to calculate XRD spectra for any user-defined combination of the microstructural parameters. The presented software library can be integrated easily into modern and efficient numerical libraries such as SciPy and PyTorch. Therefore, the program can be used either in XRD pattern-fitting methods or in the creation of training sets of XRD spectra for machine learning-based prediction of the parameters of the microstructure.

Publication Details

Journal
Repository for Publications and Research Data (ETH Zurich)
Published
2024-09-01
DOI
https://doi.org/10.3929/ethz-b-000693941
Primary Topic
X-ray Diffraction in Crystallography
Type
article
Field-Weighted Citation Impact
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article

DifFault: Simulation of diffraction patterns of faulted crystals

Repository for Publications and Research Data (ETH Zurich)
X-ray Diffraction in Crystallography
article

DifFault: Simulation of diffraction patterns of faulted crystals

article en

Abstract

We have developed a software library called DifFault to generate X-ray diffraction (XRD) patterns of cubic structures. The simulation of the XRD peak profiles in the patterns is based on physical principles and accounts for the effects of crystallite size, dislocations, and planar faults. The program is able to calculate XRD spectra for any user-defined combination of the microstructural parameters. The presented software library can be integrated easily into modern and efficient numerical libraries such as SciPy and PyTorch. Therefore, the program can be used either in XRD pattern-fitting methods or in the creation of training sets of XRD spectra for machine learning-based prediction of the parameters of the microstructure.

Repository for Publications and Research Data (ETH Zurich)
Openalex Percentile: Top 80%
X-ray Diffraction in Crystallography
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DifFault: Simulation of diffraction patterns of faulted crystals · Repository for Publications and Research Data (ETH Zurich) (2024) | TGRS Research Map | TGRS