REPETITIVE SAMPLING INSPECTION PLAN UNDER TRUNCATED LIFETEST BASED ON ONE PARAMETER POLYNOMIAL EXPONENTIAL DISTRIBUTION

This article constructs a Repetitive Sampling Inspection Plan under Truncated life test (RSIPTL) when the lifetime follows the One Parameter Polynomial Exponential (OPPE) family of distributions. In RSIPTL, a lot can be accepted or rejected in the first, second, and so on, based on the number of defective items in each sample. The OPPE has infinite support. It has transformed into its unit form to utilize finite support, i.e., having the support (0, 1). The Lindley distribution, a particular choice of the OPPE, has been studied in detail. We obtained the minimum number of items required in a lot to satisfy the consumer risk. Extensive tables are prepared for easy understanding and use of the plan for industrial workers. The RSIPTL is compared with a single sampling plan (SSP) and a two-stage reliability acceptance sampling plan (TSRASP) for Lindley and Exponential distributions. Two data sets are discussed and comparative statements are made with respect to the proposed plan.