Corrigendum: <i>In-situ</i> synchrotron x-ray photoelectron spectroscopy study of medium-temperature baking of niobium for SRF application (2024 <i>Supercond. Sci. Technol.</i> 37 075007)
Abstract Upon reviewing the published version of our work, we identified misprints in the equations, which are corrected here. Additionally, we re-evaluated the oxygen concentration depth profiles. This re-evaluation does not affect the validity of the paper’s statements or conclusions.
Publication Details
- Journal
- Superconductor Science and Technology
- Published
- 2025-03-05
- DOI
- https://doi.org/10.1088/1361-6668/adbce1
- Primary Topic
- Silicon and Solar Cell Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.00