Femtogram-Sensitive\nCantilever Platform for Dynamic\nGraphene Oxide Nanosheet Monitoring

This study introduces\na new approach to optimizing graphene\noxide\n(GO) properties using liquid-phase plasma treatment in a microenvironment.\nOur innovation exploits atomic force microscopy (AFM) cantilever frequency\ntracking to monitor mass variations in GO, which are indicative of\nsurface oxidation–reduction processes or substituent doping\n(boron/nitrogen). Complementary in situ Raman spectroscopy has observed\nD/G band shifts, and X-ray photoelectron spectroscopy (XPS) determined\nthe C/O ratio and B/N doping levels pre- and post-treatment, confirming\nchemical tuning to GO. We can achieve femtogram-level precision in\ndetecting nanomaterial mass changes by correlating elemental ratios\nwith AFM cantilever frequency measurements. This multifaceted approach\nnot only enhances our understanding of the chemical properties of\nGO but also establishes a new, versatile method for monitoring, modifying,\nand optimizing the properties of nanomaterials.