Effect of impurities on the formation of inclusions and γ-ray detection properties of Cs <sub>3</sub> Cu <sub>2</sub> I <sub>5</sub> single crystal
High-quality Cs 3 Cu 2 I 5 single crystal was successfully grown with the vertical Bridgeman method. After the zone refining of raw material CuI, the formation of CsI inclusions can be effectively restrained.
Authors
- Lian Sun (ORCID: https://orcid.org/0000-0001-9989-4750)
- Ye Chen (ORCID: https://orcid.org/0000-0003-1318-5561)
- Zungang Wang (ORCID: https://orcid.org/0009-0009-6980-5150)
- Kun Wu
- Zhi‐Yuan Li (ORCID: https://orcid.org/0000-0003-4692-5028)
- Leilei Zhang (ORCID: https://orcid.org/0000-0002-5296-8430)
- Jinglun Li (ORCID: https://orcid.org/0000-0002-4958-8488)
- Zhigang Xue (ORCID: https://orcid.org/0009-0000-9022-8727)
Institutions
- National Institute for Radiological Protection (CN)
Publication Details
- Journal
- CrystEngComm
- Published
- 2025-12-19
- DOI
- https://doi.org/10.1039/d5ce01119a
- Primary Topic
- Radiation Detection and Scintillator Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.00