Degradation-based burn-in policy for component and system levels

Burn-in has emerged as a powerful method to eliminate infant failures in components prior to field deployment. Burn-in processes generally consist of two stages: component-level and system-level. Component burn-in involves testing individual components before they are assembled into a system, while system burn-in refers to testing the complete system after assembly. This paper focuses on component and system burn-in with respect to the series system. The proposed burn-in model incorporates degradation levels of the component and system. Each interconnect defect leads to an independent failure due to connection failure, and the failure time of connection failure follows a Weibull distribution. We also present a cost model that aims to find the optimal burn-in duration for both component and system by minimizing the expected costs.