Fault diagnosis of power electronic circuits based on ICA-LSTM

A novel approach, which is based on the Imperial Competition Algorithm (ICA)-optimized Long Short-Term Memory (LSTM) neural network, is proposed to enhance the accuracy of fault diagnosis in power electronic circuits. With circuit faults considered as outputs, rectified waveforms are utilized as inputs. By employing the ICA algorithm to optimize the hyperparameters of the LSTM, a circuit fault diagnosis model based on ICA-LSTM has been successfully developed. The diagnostic performance of the ICA-LSTM model is assessed and contrasted with prevailing diagnostic approaches. The diagnostic accuracy of 98.09% is attained by the ICA-LSTM model, as demonstrated by the results. The effectiveness of the GJO-SVM model in diagnosing faults within power electronic circuits is confirmed through comparative analysis.

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Publication Details

Journal
IET conference proceedings.
Published
2025-12-01
DOI
https://doi.org/10.1049/icp.2025.3606
Primary Topic
VLSI and Analog Circuit Testing
Type
article
Field-Weighted Citation Impact
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article

Fault diagnosis of power electronic circuits based on ICA-LSTM

Jing Yang, Kelun Zhao, Yao Lu, Hua He
IET conference proceedings.
VLSI and Analog Circuit Testing
article

Fault diagnosis of power electronic circuits based on ICA-LSTM

Jing Yang, Kelun Zhao, Yao Lu, Hua He
article en

Abstract

A novel approach, which is based on the Imperial Competition Algorithm (ICA)-optimized Long Short-Term Memory (LSTM) neural network, is proposed to enhance the accuracy of fault diagnosis in power electronic circuits. With circuit faults considered as outputs, rectified waveforms are utilized as inputs. By employing the ICA algorithm to optimize the hyperparameters of the LSTM, a circuit fault diagnosis model based on ICA-LSTM has been successfully developed. The diagnostic performance of the ICA-LSTM model is assessed and contrasted with prevailing diagnostic approaches. The diagnostic accuracy of 98.09% is attained by the ICA-LSTM model, as demonstrated by the results. The effectiveness of the GJO-SVM model in diagnosing faults within power electronic circuits is confirmed through comparative analysis.

IET conference proceedings.Vol. 2025(35)
Guangzhou Metro Group (China) (CN), China Nonferrous Metals Changsha Investigation Design Institute (CN)
Openalex Percentile: Top 55%
VLSI and Analog Circuit Testing
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