Research and application of reliability improvement methods for the electronic assembly process

This paper addresses the electronic assembly process and proposes solutions to improve process reliability through practical case studies. During the circuit board trial production, on-site diagnostics and comprehensive product analysis were conducted to identify vulnerabilities affecting reliability. By implementing manufacturability design improvements, optimizing process materials, and refining process parameters, reliability risks associated with the electronic assembly process were systematically mitigated. These measures collectively reinforced the assembly process and enhanced the overall product reliability.

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Publication Details

Journal
IET conference proceedings.
Published
2025-12-01
DOI
https://doi.org/10.1049/icp.2025.3443
Primary Topic
VLSI and Analog Circuit Testing
Type
article
Field-Weighted Citation Impact
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article

Research and application of reliability improvement methods for the electronic assembly process

Chaohui Hu
IET conference proceedings.
VLSI and Analog Circuit Testing
article

Research and application of reliability improvement methods for the electronic assembly process

Chaohui Hu
article en

Abstract

This paper addresses the electronic assembly process and proposes solutions to improve process reliability through practical case studies. During the circuit board trial production, on-site diagnostics and comprehensive product analysis were conducted to identify vulnerabilities affecting reliability. By implementing manufacturability design improvements, optimizing process materials, and refining process parameters, reliability risks associated with the electronic assembly process were systematically mitigated. These measures collectively reinforced the assembly process and enhanced the overall product reliability.

IET conference proceedings.Vol. 2025(35)
China Electronic Product Reliability and Environmental Test Institute (CN)
Openalex Percentile: Top 55%
VLSI and Analog Circuit Testing
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