Model development for (imaging) single fiber reflectance spectroscopy

We present and validate an efficient Monte Carlo pipeline for reflectance computations in overlapping source-detector geometries, using it to develop models for (imaging) spectroscopy through a single fiber and assess sensitivity limits for clinical implementation.

Authors

Ton G. van Leeuwen (ORCID: https://orcid.org/0000-0002-5642-1133)
Xavier Attendu (ORCID: https://orcid.org/0000-0002-7625-1346)
Robin van Zutphen

Institutions

Amsterdam University Medical Centers (NL)

Publication Details

Published: 2025-12-17
DOI: https://doi.org/10.1117/12.3098454
Primary Topic: Optical Imaging and Spectroscopy Techniques
Type: article
Field-Weighted Citation Impact: 0.00

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article

Model development for (imaging) single fiber reflectance spectroscopy

Ton G. van Leeuwen, Xavier Attendu, Robin van Zutphen

Dec 17, 2025

Optical Imaging and Spectroscopy Techniques

article

Model development for (imaging) single fiber reflectance spectroscopy

Ton G. van Leeuwen, Xavier Attendu, Robin van Zutphen

December 17, 2025article en

Abstract

Amsterdam University Medical Centers (NL)

Openalex Percentile: Top 44%

Optical Imaging and Spectroscopy Techniques

DOI Source OpenAlex

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Model development for (imaging) single fiber reflectance spectroscopy — Ton G. van Leeuwen, Xavier Attendu, et al. · (2025) | TGRS Research Map | TGRS