Cross-Market Risk Spillovers and Tail Dependence Between U.S. and Chinese Technology-Related Equity Markets
This study investigates risk contagion and dependence structures between U.S. and Chinese technology-related stock markets, focusing on the electronics and semiconductor sectors. We employ DCC-GARCH models to capture time-varying correlations and copula models to analyze nonlinear and tail dependencies. To highlight extreme risk dynamics, we extend the analysis to Value-at-Risk (VaR) series derived from a GARCH(1,1)-Skewed-t model. Empirical results reveal three major findings. First, volatility clustering and negative skewness are evident across markets, with extreme downside risks concentrated during the 2015 Chinese stock market crash and the 2020 COVID-19 pandemic. Second, copula results show stronger upper-tail dependence in cross-border broad markets and more symmetric dependence within domestic Chinese markets, while U.S. sectoral linkages exhibit the highest vulnerability during downturns. Third, dynamic copula analysis indicates that downside contagion is episodic and crisis-driven, whereas rebound co-movements are structurally persistent. These findings contribute to understanding systemic vulnerability in global technology markets. They provide insights for investors, regulators, and policymakers on monitoring cross-market contagion and managing systemic risk under stress scenarios.
Authors
- Huihong Liu (ORCID: https://orcid.org/0000-0002-2842-7546)
- Xinmiao Zhou (ORCID: https://orcid.org/0000-0001-7895-5008)
Institutions
- Ningbo University (CN)
Publication Details
- Journal
- International Journal of Financial Studies
- Published
- 2025-12-17
- DOI
- https://doi.org/10.3390/ijfs13040242
- Primary Topic
- Financial Risk and Volatility Modeling
- Type
- article
- Field-Weighted Citation Impact
- 0.00