Optimizing coded-apertures for depth-resolved diffraction

Coded apertures, initially developed for x-ray astronomy, are gaining traction as a means of enabling depth-resolved imaging in synchrotron-based diffraction experiments. In this study, we evaluate their application to microscale diffraction, focusing on how design and acquisition parameters influence the ability to reconstruct depth-dependent scattering signals. Through systematic simulations, we investigate the impact of bit size, aperture thickness, scan length, and local pattern characteristics on the accuracy of position and signal recovery. We introduce metrics to quantify reconstruction success and identify trade-offs among design variables. Experimental validation using a synchrotron-based micro-diffraction setup confirms the key trends observed in simulation, demonstrating that a moderate scan length and mask aspect ratio suffice for robust signal recovery, even under noisy conditions. Our findings provide a framework for implementing coded apertures in various diffraction geometries, offering a scalable and sample-motion-free approach to 3D structural characterization, particularly relevant for new synchrotron facilities.

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Publication Details

Journal
Review of Scientific Instruments
Published
2025-12-01
DOI
https://doi.org/10.1063/5.0280020
Primary Topic
Advanced X-ray Imaging Techniques
Type
article
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article

Optimizing coded-apertures for depth-resolved diffraction

Doğa Gürsoy, J. Z. Tischler, Dina Sheyfer, Michael Wojcik et al.
Review of Scientific Instruments
Advanced X-ray Imaging Techniques
article

Optimizing coded-apertures for depth-resolved diffraction

Doğa Gürsoy, J. Z. Tischler, Dina Sheyfer, Michael Wojcik, Wenjun Liu
article en

Abstract

Coded apertures, initially developed for x-ray astronomy, are gaining traction as a means of enabling depth-resolved imaging in synchrotron-based diffraction experiments. In this study, we evaluate their application to microscale diffraction, focusing on how design and acquisition parameters influence the ability to reconstruct depth-dependent scattering signals. Through systematic simulations, we investigate the impact of bit size, aperture thickness, scan length, and local pattern characteristics on the accuracy of position and signal recovery. We introduce metrics to quantify reconstruction success and identify trade-offs among design variables. Experimental validation using a synchrotron-based micro-diffraction setup confirms the key trends observed in simulation, demonstrating that a moderate scan length and mask aspect ratio suffice for robust signal recovery, even under noisy conditions. Our findings provide a framework for implementing coded apertures in various diffraction geometries, offering a scalable and sample-motion-free approach to 3D structural characterization, particularly relevant for new synchrotron facilities.

Review of Scientific InstrumentsVol. 96(12)
Argonne National Laboratory (US)
Openalex Percentile: Top 51%
Advanced X-ray Imaging Techniques
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