An edge illumination x-ray multi-contrast imaging system using metal-powder absorption masks

Edge illumination (EI) x-ray multi-contrast imaging technology has emerged as a crucial research direction due to its ability to simultaneously retrieve absorption, phase, and scattering images. However, the high cost of the EI system, composed of masks, limits its wider applications. In this study, an EI system composed of cost-effective metal-powder absorption masks is proposed. Through the mask test and imaging experiments, it has been demonstrated that the metal-powder absorption masks fulfill the requirement of EI. With further investigations in deposition homogeneity and depth, the EI system composed of metal-powder absorption masks will be a promising, cost-effective alternative for future EI applications.