Intelligent cybersecurity management in industrial IoT system using attribute reduction with collaborative deep learning enabled false data injection attack detection approach

The rapid adoption of the Industrial Internet of Things (IIoT) model has exposed methods to inadequate security measures. False data injection attacks (FDIAs) pose a significant security threat in IIoT, as they aim to mislead industrial platforms by manipulating sensor readings. In IIoT, owing to the data attacker's changeability, the FDIA is the most critical intrusion network. As aggressive devices permitted in the network perform their typical data-collecting tasks, identifying an FDIA becomes a nontrivial effort due to potential attacks. Conventional attack detection models have proven insufficient in addressing FDIAs, and most current countermeasures focus on the need to legalise data, primarily in the context of data clustering services. Presently, deep learning (DL) systems are employed for detecting FDIA in real-time and supply personalised protective measures to the threat. This paper presents an Intelligent Management of False Data Injection Attacks Using Feature Selection and Voting Classifier (IMFDIA-FSVC) technique in IIoT systems. The primary purpose of the IMFDIA-FSVC technique is to develop a model for detecting and mitigating FDIAs to ensure safe and trustworthy operations of IIoT systems. Initially, the data pre-processing stage involves two stages: missing value analysis and normalisation to standardise the input data for an effective study. For an effective feature selection, the IMFDIA-FSVC model utilises a statistical and information-theoretic selection (SITS) technique to select optimal features from the input data. Finally, the classification process is mainly deployed by three models: the temporal convolutional network (TCN), the deep belief network (DBN), and the autoencoder (AE). An ensemble classifier is then performed using the voting classifier. The comparison study of the IMFDIA-FSVC method showed a superior accuracy value of 99.15% compared to existing models on the IIoT and FDIA datasets.