Modeling of Transparent Mesh Technology — Wideband Dispersion Model from Scattering Matrix
In recent years, transparent technology has seen a significant advancement in hardware devices, accordingly, researchers are becoming increasingly interested in transparent and conductive materials, one key strategy in transparent technology is the use of mesh metallization, which balances transparency and high-frequency performance. This study proposes a new mathematical model that aims to accurately represent how the meshed microstrip line behaves at frequencies up to 40 GHz and model the dispersive behavior of the transmission line using analytical calculations. This work focuses on determining the equivalent line parameters, such as propagation constants, attenuation constants, and propagation mode dispersion, which are crucial for characterizing line performance across various operational frequencies. This involves extracting the measured scattering parameters of the transmission line and converting them to an equivalent Chain Matrix. This transformation process is based on specific equations that relate the elements of the <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$S$</tex>-parameter matrix to those of the <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$A B C D$</tex> matrix.
Authors
- Tchanguiz Razban
- Mohammed El Gibari (ORCID: https://orcid.org/0009-0004-3451-4314)
- Yann Mahé (ORCID: https://orcid.org/0000-0001-7916-2544)
- Amira Merainani
Institutions
- Centre National de la Recherche Scientifique (FR)
- Institut d'Électronique et des Technologies du numéRique (FR)
- Laboratoire des Sciences du Numérique de Nantes (FR)
Publication Details
- Published
- 2025-05-04
- DOI
- https://doi.org/10.1109/piers-spring66516.2025.11276779
- Primary Topic
- Microwave and Dielectric Measurement Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00