Unveiling nano-scale crystal deformation using coherent X-ray dynamical diffraction
Abstract Visualization of internal deformation fields in crystalline materials helps bridge the gap between theoretical models and practical applications. Applying Bragg coherent diffraction imaging under X-ray dynamical diffraction conditions provides a promising approach to the longstanding challenge of investigating the deformation fields in micron-sized crystals. Here, we present an automatic differentiation-based reconstruction method that integrates dynamical scattering theory to accurately reconstruct deformation fields in large crystals. Using this forward model, our simulated and experimental results demonstrate that three-dimensional local strain information inside a large crystal can be accurately reconstructed under coherent X-ray dynamical diffraction conditions with Bragg coherent X-ray diffraction imaging. These findings open an avenue for extending the investigation of local deformation fields to microscale crystals while maintaining nanoscale resolution, leveraging the enhanced coherence and brightness of advanced X-ray sources.
Authors
- Wei Wang (ORCID: https://orcid.org/0000-0001-7009-3159)
- Aiguo Li (ORCID: https://orcid.org/0000-0003-1977-2636)
- David Yang (ORCID: https://orcid.org/0000-0002-1062-7371)
- Shinjae Yoo (ORCID: https://orcid.org/0000-0003-4378-6448)
- Wonsuk Cha (ORCID: https://orcid.org/0000-0001-8888-4258)
- Ross Harder (ORCID: https://orcid.org/0000-0002-7036-9431)
- Longlong Wu (ORCID: https://orcid.org/0000-0002-1336-2743)
- Ian Robinson (ORCID: https://orcid.org/0000-0003-4897-5221)
Institutions
- University of Science and Technology of China (CN)
- Argonne National Laboratory (US)
- Chinese Academy of Sciences (CN)
- Brookhaven National Laboratory (US)
- London Centre for Nanotechnology (GB)
- Shanghai Advanced Research Institute (CN)
- University College London (GB)
Publication Details
- Journal
- npj Computational Materials
- Published
- 2025-12-14
- DOI
- https://doi.org/10.1038/s41524-025-01858-1
- Primary Topic
- Advanced X-ray Imaging Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- National Science Foundation
- U.S. Department of Energy
- Chinese Academy of Sciences
- Office of Science
- Division of Materials Research
- Basic Energy Sciences
- Brookhaven National Laboratory