Are Diagnostic Concepts Within the Reach of LLMs?
Model-based diagnosis is a cornerstone of system health monitoring, allowing for the identification of faulty components based on observed behavior and a formal system model. However, obtaining a useful and reliable model is often an expensive and manual task. While the generation of a formal model was the aim of previous work, in this paper, we propose a methodology to use large language models to generate Minimal Structurally Overdetermined sets (MSOs). MSOs are specific subsets of the model equations from which diagnosis tests can be obtained. We investigate two different directions: (i) the large-language-models' ability to generate MSO sets for hybrid systems, similar to those generated by the well-known Fault Diagnosis Toolbox (FDT) (ii) the automated generation of MSOs for Boolean circuits, as well as the computation of the diagnoses. We thus show how both dynamic and static systems can be analysed by large-language models and how their output can be used for effective fault diagnosis. We evaluate our approach on a set of arithmetic and logic circuits, using OpenAI’s LLMs 4o-mini, o1, and o3-mini.
Authors
- Oliver Niggemann (ORCID: https://orcid.org/0000-0001-8747-3596)
- Silke Merkelbach (ORCID: https://orcid.org/0009-0005-9598-5117)
- Louise Travé-Massuyès (ORCID: https://orcid.org/0000-0002-5322-8418)
- Élodie Chanthery (ORCID: https://orcid.org/0000-0003-0015-5566)
- Alexander Diedrich (ORCID: https://orcid.org/0000-0002-8674-6895)
- Anna Sztyber (ORCID: https://orcid.org/0000-0002-6464-8194)
- Maxence Glotin
- Karol Kukla
Institutions
- Warsaw University of Technology (PL)
- Centre National de la Recherche Scientifique (FR)
- Université Fédérale de Toulouse Midi-Pyrénées (FR)
- Helmut Schmidt University (DE)
- Laboratoire d'Analyse et d'Architecture des Systèmes (FR)
- Institut National des Sciences Appliquées de Toulouse (FR)
- Fraunhofer Institute for Mechatronic Systems Design (DE)
Publication Details
- Journal
- SPIRE - Sciences Po Institutional REpository
- Published
- 2025-01-01
- DOI
- https://doi.org/10.4230/oasics.dx.2025.2
- Primary Topic
- VLSI and Analog Circuit Testing
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- Agence Nationale de la Recherche