In2O3: An Oxide Semiconductor for Thin-Film Transistors, a Short Review

With the discovery of amorphous oxide semiconductors, a new era of electronics opened. Indium gallium zinc oxide (IGZO) overcame the problems of amorphous and poly-silicon by reaching mobilities of ~10 cm<sup>2</sup>/Vs and demonstrating thin-film transistors (TFTs) are easy to manufacture on transparent and flexible substrates. However, mobilities over 30 cm<sup>2</sup>/Vs have been difficult to reach and other materials have been introduced. Recently, polycrystalline In<sub>2</sub>O<sub>3</sub> has demonstrated breakthroughs in the field. In<sub>2</sub>O<sub>3</sub> TFTs have attracted attention because of their high mobility of over 100 cm<sup>2</sup>/Vs, which has been achieved multiple times, and because of their use in scaled devices with channel lengths down to 10 nm for high integration in back-end-of-the-line (BEOL) applications and others. The present review focuses first on the material properties with the understanding of the bandgap value, the importance of the position of the charge neutrality level (CNL), the doping effect of various atoms (Zr, Ge, Mo, Ti, Sn, or H) on the carrier concentration, the optical properties, the effective mass, and the mobility. We introduce the effects of the non-parabolicity of the conduction band and how to assess them. We also introduce ways to evaluate the CNL position (usually at ~E<sub>C</sub> + 0.4 eV). Then, we describe TFTs' general properties and parameters, like the field effect mobility, the subthreshold swing, the measurements necessary to assess the TFT stability through positive and negative bias temperature stress, and the negative bias illumination stress (NBIS), to finally introduce In<sub>2</sub>O<sub>3</sub> TFTs. Then, we will introduce vacuum and non-vacuum processes like spin-coating and liquid metal printing. We will introduce the various dopants and their applications, from mobility and crystal size improvements with H to NBIS improvements with lanthanides. We will also discuss the importance of device engineering, introducing how to choose the passivation layer, the source and drain, the gate insulator, the substrate, but also the possibility of advanced engineering by introducing the use of dual gate and 2 DEG devices on the mobility improvement. Finally, we will introduce the recent breakthroughs where In<sub>2</sub>O<sub>3</sub> TFTs are integrated in neuromorphic applications and 3D integration.

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Publication Details

Journal
Molecules
Published
2025-12-12
DOI
https://doi.org/10.3390/molecules30244762
Citations
1
Primary Topic
Thin-Film Transistor Technologies
Type
article
Field-Weighted Citation Impact
0.73
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article

In2O3: An Oxide Semiconductor for Thin-Film Transistors, a Short Review

Christophe Avis, Jin Jang
1 citations
Molecules
Thin-Film Transistor Technologies
0.73
article

In2O3: An Oxide Semiconductor for Thin-Film Transistors, a Short Review

Christophe Avis, Jin Jang
article en
1 citations

Abstract

With the discovery of amorphous oxide semiconductors, a new era of electronics opened. Indium gallium zinc oxide (IGZO) overcame the problems of amorphous and poly-silicon by reaching mobilities of ~10 cm<sup>2</sup>/Vs and demonstrating thin-film transistors (TFTs) are easy to manufacture on transparent and flexible substrates. However, mobilities over 30 cm<sup>2</sup>/Vs have been difficult to reach and other materials have been introduced. Recently, polycrystalline In<sub>2</sub>O<sub>3</sub> has demonstrated breakthroughs in the field. In<sub>2</sub>O<sub>3</sub> TFTs have attracted attention because of their high mobility of over 100 cm<sup>2</sup>/Vs, which has been achieved multiple times, and because of their use in scaled devices with channel lengths down to 10 nm for high integration in back-end-of-the-line (BEOL) applications and others. The present review focuses first on the material properties with the understanding of the bandgap value, the importance of the position of the charge neutrality level (CNL), the doping effect of various atoms (Zr, Ge, Mo, Ti, Sn, or H) on the carrier concentration, the optical properties, the effective mass, and the mobility. We introduce the effects of the non-parabolicity of the conduction band and how to assess them. We also introduce ways to evaluate the CNL position (usually at ~E<sub>C</sub> + 0.4 eV). Then, we describe TFTs' general properties and parameters, like the field effect mobility, the subthreshold swing, the measurements necessary to assess the TFT stability through positive and negative bias temperature stress, and the negative bias illumination stress (NBIS), to finally introduce In<sub>2</sub>O<sub>3</sub> TFTs. Then, we will introduce vacuum and non-vacuum processes like spin-coating and liquid metal printing. We will introduce the various dopants and their applications, from mobility and crystal size improvements with H to NBIS improvements with lanthanides. We will also discuss the importance of device engineering, introducing how to choose the passivation layer, the source and drain, the gate insulator, the substrate, but also the possibility of advanced engineering by introducing the use of dual gate and 2 DEG devices on the mobility improvement. Finally, we will introduce the recent breakthroughs where In<sub>2</sub>O<sub>3</sub> TFTs are integrated in neuromorphic applications and 3D integration.

MoleculesVol. 30(24)
Kyung Hee University (KR)
Openalex Percentile: Top 21%
Thin-Film Transistor Technologies
0.73
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