Autonomous fabrication of tailored defect structures in 2D materials using machine learning-enabled scanning transmission electron microscopy
Abstract Materials with tailored quantum properties can be engineered from atomic-scale assembly techniques, but existing methods often lack the agility and accuracy to precisely and intelligently control the manufacturing process. Here, we demonstrate a fully autonomous approach for fabricating atomic-level defects using electron beams in scanning transmission electron microscopy (STEM) that combines advanced machine learning and automated beam control. As a proof of concept, we achieved controlled fabrication of MoS-nanowire (MoS-NW) edge structures by iterative and targeted exposure of MoS₂ monolayer to a focused electron beam to selectively eject sulfur atoms, utilizing high-angle annular dark-field (HAADF) imaging for feedback-controlled monitoring of structural evolution of defects. A machine learning framework combining a random forest model and a convolutional neural network (CNN) was developed to decode the HAADF image and accurately identify atomic positions and species. This atomic-level information was then integrated into an autonomous decision-making platform, which applied predefined fabrication strategies to instruct beam control about atomic sites to be ejected. The selected sites were subsequently exposed to a localized electron beam using an FPGA-controlled scan routine with precise control over beam positioning and duration. While the MoS-NW edge structures produced exhibit promising mechanical and electronic properties 1–3 , the proposed methods to build the autonomous fabrication framework is material-agnostic and can be extended to other 2D materials for the creation of diverse defect structures and heterostructures beyond MoS₂.
Authors
- Rama Krishnan Vasudevan (ORCID: https://orcid.org/0000-0003-4692-8579)
- Raymond R. Unocic (ORCID: https://orcid.org/0000-0002-1777-8228)
- Zijie Wu (ORCID: https://orcid.org/0000-0003-3369-8807)
- Ayana Ghosh (ORCID: https://orcid.org/0000-0002-0432-3689)
- Kai Xiao (ORCID: https://orcid.org/0000-0002-0402-8276)
- Kevin M. Roccapriore (ORCID: https://orcid.org/0000-0001-9907-6790)
- Stephen Jesse (ORCID: https://orcid.org/0000-0002-1168-8483)
- Matthew G. Boebinger (ORCID: https://orcid.org/0000-0001-9622-2043)
Institutions
- Oak Ridge National Laboratory (US)
- North Carolina State University (US)
- University of Tennessee at Knoxville (US)
Publication Details
- Journal
- npj Computational Materials
- Published
- 2026-04-27
- DOI
- https://doi.org/10.1038/s41524-026-02025-w
- Primary Topic
- Advanced Electron Microscopy Techniques and Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- U.S. Department of Energy
- Battelle
- UT-Battelle
- Basic Energy Sciences