Critical Considerations for TOF‐SIMS Sample Preparation and Parameter Optimization
Sample preparation and processing are critical for ensuring the validity of TOF-SIMS detection results, while selecting appropriate testing parameters facilitates the acquisition of authentic and valid sample information. The presented methodology in this paper serves as a valuable reference for ensuring data reliability in TOF-SIMS analyses.
Authors
- Yanfang Pan
- Chuqi Shi
- Yikun Pan
- Qin Yang
Institutions
- Tsinghua–Berkeley Shenzhen Institute (CN)
- Tsinghua University (CN)
Publication Details
- Journal
- Rapid Communications in Mass Spectrometry
- Published
- 2025-12-08
- DOI
- https://doi.org/10.1002/rcm.70010
- Primary Topic
- Ion-surface interactions and analysis
- Type
- article
- Field-Weighted Citation Impact
- 0.00