Multi-Task Deep Learning for Surface Metrology
A reproducible deep learning framework is presented for surface metrology to predict surface texture parameters together with their reported standard uncertainties. Using a multi-instrument dataset spanning tactile and optical systems, we jointly address measurement system type classification and regression of key surface parameters-arithmetic mean roughness (Ra), mean peak-to-valley roughness (Rz), and total roundness deviation (RONt)-alongside their reported standard uncertainties. Uncertainty is modelled via quantile and heteroscedastic regression heads, with post hoc conformal calibration used to obtain calibrated prediction intervals. On a held-out test set, high fidelity was achieved by single-target regressors (coefficients of determination: Ra 0.9824, Rz 0.9847, RONt 0.9918), with two uncertainty targets also well modelled (standard uncertainty of Ra 0.9899, standard uncertainty of Rz 0.9955); the standard uncertainty of RONt remained more difficult to learn (0.4934). The classifier reached 92.85% accuracy, and probability calibration was essentially unchanged after temperature scaling (expected calibration error 0.00504 → 0.00503 on the test split). Negative transfer was observed for naive multi-output trunks, with single-target models performing better. These results provide calibrated predictions suitable for informing instrument selection and acceptance decisions in metrological workflows.
Authors
- Michał Wieczorowski (ORCID: https://orcid.org/0000-0001-7526-8368)
- Adam Gąska (ORCID: https://orcid.org/0000-0002-2178-3919)
- P. Sosinowski (ORCID: https://orcid.org/0000-0002-5415-2734)
- Krzysztof Stępień (ORCID: https://orcid.org/0000-0002-4955-5344)
- Michał Nawotka (ORCID: https://orcid.org/0009-0009-5275-1379)
- Marta Rępalska (ORCID: https://orcid.org/0000-0002-9589-4320)
- Adam Wójtowicz (ORCID: https://orcid.org/0000-0003-1963-521X)
- Bartosz Gapiński (ORCID: https://orcid.org/0000-0003-0206-1942)
- D. Kucharski (ORCID: https://orcid.org/0000-0002-9880-9670)
- Piotr Sobecki (ORCID: https://orcid.org/0000-0003-1752-2393)
- Tomasz Kowaluk (ORCID: https://orcid.org/0000-0002-3510-274X)
Institutions
- Warsaw University of Technology (PL)
- Kielce University of Technology (PL)
- Cracow University of Technology (PL)
- National Information Processing Institute (PL)
- Central Office of Measures (PL)
- Poznań University of Technology (PL)
Publication Details
- Journal
- Sensors
- Published
- 2025-12-08
- DOI
- https://doi.org/10.3390/s25247471
- Citations
- 1
- Primary Topic
- Surface Roughness and Optical Measurements
- Type
- article
- Field-Weighted Citation Impact
- 1.33