Lensless single-shot dual-wavelength digital holography with sub-pixel resolution and centimeter depth range

Lensless single-shot dual-wavelength digital holography is resolution limited by the pixel-size of the camera and often has an insufficient depth range. We present a novel dual-wavelength holographic configuration with expanding wavefront illumination that breaks the pixel-limited resolution barrier and achieves diffraction-limited spatial resolution. By implementing expanding wavefront illumination with dual-wavelength digital holography based on a wavelength-tunable laser, we achieve a high-resolution centimeter-scale depth range. A quantitative precision analysis demonstrates that single-shot acquisition reaches the shot-noise-limited depth detection. The proposed holographic scheme provides a robust 3D optical inspection solution for high-throughput, micro-scale resolution industrial inline metrology.

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Publication Details

Journal
APL Photonics
Published
2025-12-01
DOI
https://doi.org/10.1063/5.0280018
Primary Topic
Digital Holography and Microscopy
Type
article
Field-Weighted Citation Impact
0.00
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article

Lensless single-shot dual-wavelength digital holography with sub-pixel resolution and centimeter depth range

Jeroen Kalkman, H. P. Urbach, Huangcheng Shangguan
APL Photonics
Digital Holography and Microscopy
article

Lensless single-shot dual-wavelength digital holography with sub-pixel resolution and centimeter depth range

Jeroen Kalkman, H. P. Urbach, Huangcheng Shangguan
article en

Abstract

Lensless single-shot dual-wavelength digital holography is resolution limited by the pixel-size of the camera and often has an insufficient depth range. We present a novel dual-wavelength holographic configuration with expanding wavefront illumination that breaks the pixel-limited resolution barrier and achieves diffraction-limited spatial resolution. By implementing expanding wavefront illumination with dual-wavelength digital holography based on a wavelength-tunable laser, we achieve a high-resolution centimeter-scale depth range. A quantitative precision analysis demonstrates that single-shot acquisition reaches the shot-noise-limited depth detection. The proposed holographic scheme provides a robust 3D optical inspection solution for high-throughput, micro-scale resolution industrial inline metrology.

APL PhotonicsVol. 10(12)
Delft University of Technology (NL)
Openalex Percentile: Top 69%
Digital Holography and Microscopy
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