XPS Insight Note: Carbon Sp <sup>2</sup> –Sp <sup>3</sup> Ratios Derived From the Carbon Auger Signal and Its Accuracy
ABSTRACT Understanding the surface chemistry of carbon materials is typically explored using x‐ray photoelectron spectroscopy (XPS). Researchers typically focus on the C(1s) core‐level to deduce chemistry, often overlooking complementary spectral information. This insight note summarizes the use of the x‐ray excited Auger peak for carbon, deriving the D‐parameter to aid in the measurement of sp 2 —sp 3 ratios.
Authors
- David Morgan (ORCID: https://orcid.org/0000-0002-6571-5731)
- Alexander Graf (ORCID: https://orcid.org/0000-0003-4870-7622)
- Mark A. Isaacs (ORCID: https://orcid.org/0000-0002-0335-4272)
Institutions
- Research Complex at Harwell (GB)
- University College London (GB)
- Cardiff University (GB)
Publication Details
- Journal
- Surface and Interface Analysis
- Published
- 2025-12-07
- DOI
- https://doi.org/10.1002/sia.70037
- Primary Topic
- Electron and X-Ray Spectroscopy Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- Engineering and Physical Sciences Research Council