Near-infrared MINFLUX imaging enabled by suppression of fluorophore blinking

MINimal photon FLUXes (MINFLUX) offers nanometer localization precision, with lower fluorophore requirements than for other super-resolution microscopy (SRM) techniques. Nonetheless, low localization probabilities hamper its application, and use of less bright and photostable fluorophores, including near-infrared (NIR) fluorophores has been difficult to realize. Here, we devised strategies overcoming these limitations. We systematically studied the blinking properties of far-red and NIR cyanine fluorophores, followed by simulations of MINFLUX localizations, over typical time scales (microsecond to 10 milliseconds), sample and excitation conditions for MINFLUX imaging. We identified fluorophore blinking via photoisomerization and photoreduction as the main cause of localization errors, and that use of balanced redox buffers and repetitive excitation beam scans can suppress such errors. Implementing these strategies, we could demonstrate NIR-MINFLUX imaging with nanometer localization precision, thereby also presenting an overall strategy to design optimal sample and excitation conditions, for MINFLUX imaging and for SRM in general.

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Publication Details

Journal
Science Advances
Published
2025-12-05
DOI
https://doi.org/10.1126/sciadv.adw3149
Primary Topic
Advanced Fluorescence Microscopy Techniques
Type
article
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article

Near-infrared MINFLUX imaging enabled by suppression of fluorophore blinking

Jerker Widengren, Ana Agostinho, Joachim Piguet, Mark Bates et al.
Science Advances
Advanced Fluorescence Microscopy Techniques
article

Near-infrared MINFLUX imaging enabled by suppression of fluorophore blinking

Jerker Widengren, Ana Agostinho, Joachim Piguet, Mark Bates, Alexander Egner, Chinmaya Venugopal Srambickal, René Siegmund, Lenny Reinkensmeier, Hanie M Esmaeeli
article en

Abstract

MINimal photon FLUXes (MINFLUX) offers nanometer localization precision, with lower fluorophore requirements than for other super-resolution microscopy (SRM) techniques. Nonetheless, low localization probabilities hamper its application, and use of less bright and photostable fluorophores, including near-infrared (NIR) fluorophores has been difficult to realize. Here, we devised strategies overcoming these limitations. We systematically studied the blinking properties of far-red and NIR cyanine fluorophores, followed by simulations of MINFLUX localizations, over typical time scales (microsecond to 10 milliseconds), sample and excitation conditions for MINFLUX imaging. We identified fluorophore blinking via photoisomerization and photoreduction as the main cause of localization errors, and that use of balanced redox buffers and repetitive excitation beam scans can suppress such errors. Implementing these strategies, we could demonstrate NIR-MINFLUX imaging with nanometer localization precision, thereby also presenting an overall strategy to design optimal sample and excitation conditions, for MINFLUX imaging and for SRM in general.

Science AdvancesVol. 11(49)
Institut für Nanophotonik (DE), KTH Royal Institute of Technology (SE)
Openalex Percentile: Top 73%
Advanced Fluorescence Microscopy Techniques
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Near-infrared MINFLUX imaging enabled by suppression of fluorophore blinking — Jerker Widengren, Ana Agostinho, et al. · Science Advances (2025) | TGRS Research Map | TGRS