Verification of Microprobe Calibration Based on Actual Diameter Measurement of the Probe Tip Sphere

In three-dimensional measurement using a microprobing system with a micrometric spherical tip, a deviation in the diameter of the probe tip sphere causes measurement errors. In a typical probing system calibration, the effective diameter of the probe tip sphere is estimated based on the probing coordinates obtained on a calibration artifact with guaranteed dimensional accuracy. On the other hand, the calibration results of the effective diameter of the probe tip include uncertainty sources derived from errors inherent to the calibration artifacts and probing system itself, which cannot be eliminated. In this study, a micro-stylus with a tip sphere having a diameter less than 25 μm was fabricated. The actual diameter of its tip sphere was measured based on the contour form obtained along with the high-precision plane. The effective diameter of the same microprobe tip sphere was also measured by probing inside the precision micro-slit constructed with three gauge blocks. The measurement uncertainties of the actual and effective diameters were calculated and compared to each other. The measurement uncertainty of the actual diameter of the microprobe tip sphere based on the contour form measurement was confirmed to be smaller than that of the effective diameter measurement uncertainty, as it did not include errors inherent in the probing system. Furthermore, because the difference between the actual and effective diameters was smaller than that of the measurement uncertainties, the effectiveness of measuring actual diameter in microprobe calibration has been demonstrated.

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Publication Details

Journal
Metrology
Published
2025-12-01
DOI
https://doi.org/10.3390/metrology5040073
Primary Topic
Force Microscopy Techniques and Applications
Type
article
Field-Weighted Citation Impact
0.00

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article

Verification of Microprobe Calibration Based on Actual Diameter Measurement of the Probe Tip Sphere

Kazuhide Kamiya, Kenta MATSUMOTO, Toshifumi Tomioka, Shota Ito et al.
Metrology
Force Microscopy Techniques and Applications
article

Verification of Microprobe Calibration Based on Actual Diameter Measurement of the Probe Tip Sphere

Kazuhide Kamiya, Kenta MATSUMOTO, Toshifumi Tomioka, Shota Ito, Yuka Sugisawa, Daichi Inukai
article en

Abstract

In three-dimensional measurement using a microprobing system with a micrometric spherical tip, a deviation in the diameter of the probe tip sphere causes measurement errors. In a typical probing system calibration, the effective diameter of the probe tip sphere is estimated based on the probing coordinates obtained on a calibration artifact with guaranteed dimensional accuracy. On the other hand, the calibration results of the effective diameter of the probe tip include uncertainty sources derived from errors inherent to the calibration artifacts and probing system itself, which cannot be eliminated. In this study, a micro-stylus with a tip sphere having a diameter less than 25 μm was fabricated. The actual diameter of its tip sphere was measured based on the contour form obtained along with the high-precision plane. The effective diameter of the same microprobe tip sphere was also measured by probing inside the precision micro-slit constructed with three gauge blocks. The measurement uncertainties of the actual and effective diameters were calculated and compared to each other. The measurement uncertainty of the actual diameter of the microprobe tip sphere based on the contour form measurement was confirmed to be smaller than that of the effective diameter measurement uncertainty, as it did not include errors inherent in the probing system. Furthermore, because the difference between the actual and effective diameters was smaller than that of the measurement uncertainties, the effectiveness of measuring actual diameter in microprobe calibration has been demonstrated.

MetrologyVol. 5(4)
Toyama Prefectural University (JP)
Machine Tool Engineering Foundation, Mazak Foundation, Japan Society for the Promotion of Science
Openalex Percentile: Top 69%
Force Microscopy Techniques and Applications
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