High-Performance p-Cu2O/n-β-Ga2O3 Heterojunction Barrier Schottky Diodes with Copper Contact

This study demonstrates the fabrication of high-performance p-Cu<sub>2</sub>O/n-β-Ga<sub>2</sub>O<sub>3</sub> heterojunction barrier Schottky (JBS) diodes using copper as a low-work-function anode metal. By optimizing the Cu<sub>2</sub>O spacing to 4 μm, the device achieves a turn-on voltage of 0.78 V, a breakdown voltage of 1700 V, and a specific on-resistance of 5.91 mΩ·cm<sup>2</sup>, yielding a power figure of merit of 0.49 GW/cm<sup>2</sup>. The JBS diode also exhibits stable electrical characteristics across the temperature range of 300-425 K. Under a 200 V reverse stress for 5000 s, the JBS diode shows only a 4.16% degradation in turn-on voltage and a 1.15-fold increase in dynamic specific on-resistance variation, highlighting its excellent resistance to stress-induced degradation. These results indicate that Cu<sub>2</sub>O/Ga<sub>2</sub>O<sub>3</sub> JBS diodes are promising candidates for next-generation high-efficiency and high-voltage power electronic applications.

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Publication Details

Journal
Nanomaterials
Published
2025-12-05
DOI
https://doi.org/10.3390/nano15241840
Primary Topic
Ga2O3 and related materials
Type
article
Field-Weighted Citation Impact
0.00

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article

High-Performance p-Cu2O/n-β-Ga2O3 Heterojunction Barrier Schottky Diodes with Copper Contact

C. Chen, Kah‐Wee Ang, Hongyu Yu, Xiaohui Wang et al.
Nanomaterials
Ga2O3 and related materials
article

High-Performance p-Cu2O/n-β-Ga2O3 Heterojunction Barrier Schottky Diodes with Copper Contact

C. Chen, Kah‐Wee Ang, Hongyu Yu, Xiaohui Wang, Qing Wang, Xuhui Liu, Yanquan Geng, Haozhe Yu, M.F. Li
article en

Abstract

This study demonstrates the fabrication of high-performance p-Cu<sub>2</sub>O/n-β-Ga<sub>2</sub>O<sub>3</sub> heterojunction barrier Schottky (JBS) diodes using copper as a low-work-function anode metal. By optimizing the Cu<sub>2</sub>O spacing to 4 μm, the device achieves a turn-on voltage of 0.78 V, a breakdown voltage of 1700 V, and a specific on-resistance of 5.91 mΩ·cm<sup>2</sup>, yielding a power figure of merit of 0.49 GW/cm<sup>2</sup>. The JBS diode also exhibits stable electrical characteristics across the temperature range of 300-425 K. Under a 200 V reverse stress for 5000 s, the JBS diode shows only a 4.16% degradation in turn-on voltage and a 1.15-fold increase in dynamic specific on-resistance variation, highlighting its excellent resistance to stress-induced degradation. These results indicate that Cu<sub>2</sub>O/Ga<sub>2</sub>O<sub>3</sub> JBS diodes are promising candidates for next-generation high-efficiency and high-voltage power electronic applications.

NanomaterialsVol. 15(24)
National University of Singapore (SG), Shenzhen Polytechnic University (CN), Southern University of Science and Technology (CN), Peng Cheng Laboratory (CN)
National Natural Science Foundation of China, Southern University of Science and Technology
Openalex Percentile: Top 72%
Ga2O3 and related materials
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High-Performance p-Cu2O/n-β-Ga2O3 Heterojunction Barrier Schottky Diodes with Copper Contact — C. Chen, Kah‐Wee Ang, et al. · Nanomaterials (2025) | TGRS Research Map | TGRS