Tight PAC-Bayesian Risk Certificates for Contrastive Learning

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Publication Details

Journal
SIAM Journal on Mathematics of Data Science
Published
2025-12-05
DOI
https://doi.org/10.1137/24m1715283
Primary Topic
Domain Adaptation and Few-Shot Learning
Type
article
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article

Tight PAC-Bayesian Risk Certificates for Contrastive Learning

Debarghya Ghoshdastidar, Anna van Elst
SIAM Journal on Mathematics of Data Science
Domain Adaptation and Few-Shot Learning
article

Tight PAC-Bayesian Risk Certificates for Contrastive Learning

Debarghya Ghoshdastidar, Anna van Elst
article en

Abstract

No abstract available for this paper.
SIAM Journal on Mathematics of Data ScienceVol. 7(4)
Télécom Paris (FR), Laboratoire Traitement et Communication de l’Information (FR), Technical University of Munich (DE)
Openalex Percentile: Top 79%
Domain Adaptation and Few-Shot Learning
DOIOpen Access PDFOpenAlex
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Tight PAC-Bayesian Risk Certificates for Contrastive Learning — Debarghya Ghoshdastidar, Anna van Elst · SIAM Journal on Mathematics of Data Science (2025) | TGRS Research Map | TGRS