A novel full-chip afterpulsing evaluation technique for 116 × 160 Ge-on-Si SPAD array
This Letter presents a novel on-chip afterpulsing characterization method demonstrated using gated-mode short-wave infrared single photon avalanche diode arrays, effectively overcoming the measurement limitations of conventional methods. Through this approach, we first achieve a comprehensive evaluation of the full-chip afterpulsing effect by adjusting the ratio between gated-on time and gated-off time and employing a sampling window technique. Experimentally validated using a room-temperature-operated 160 × 116 Ge-on-Si single photon avalanche diode array, the approach clearly reveals the potential pixel-to-pixel variations in afterpulsing behavior across SWIR single-photon avalanche diode arrays, highlighting the critical importance of full-chip evaluation for designing and optimizing gating period.
Authors
- Chao‐Hsin Wu (ORCID: https://orcid.org/0000-0001-7849-773X)
- Calvin Yi‐Ping Chao (ORCID: https://orcid.org/0000-0002-1495-576X)
- Chen Chien (ORCID: https://orcid.org/0009-0007-8047-0078)
- Tzu-Jui Wang
- Shih-Min A. Huang (ORCID: https://orcid.org/0009-0004-9587-3986)
- Shang-Fu Yeh (ORCID: https://orcid.org/0000-0003-2690-4887)
- Jau-Yang Wu (ORCID: https://orcid.org/0000-0003-1484-3677)
- Ming-Chieh Hsu (ORCID: https://orcid.org/0000-0002-7381-4481)
- Honyih Tu (ORCID: https://orcid.org/0009-0002-3056-0909)
- Pi-Ju Cheng (ORCID: https://orcid.org/0009-0009-9541-5076)
Institutions
- National Taipei University of Technology (TW)
- National Taiwan University of Science and Technology (TW)
- Research Center for Information Technology Innovation, Academia Sinica (TW)
- Taiwan Semiconductor Manufacturing Company (China) (CN)
- Taiwan Semiconductor Manufacturing Company (Taiwan) (TW)
Publication Details
- Journal
- APL Photonics
- Published
- 2025-12-01
- DOI
- https://doi.org/10.1063/5.0291080
- Citations
- 1
- Primary Topic
- Advanced Optical Sensing Technologies
- Type
- article
- Field-Weighted Citation Impact
- 1.19
Funders
- Lam Research
- Taiwan Semiconductor Manufacturing Company
- Chung-Shan Institute of Science and Technology
- National Taiwan University
- National Science and Technology Council