Dielectric Constant of R410A: A Study Applying Molecular Dynamics Simulations and New Experimental Data

The dielectric behavior of R410A is analyzed through Molecular Dynamics (MD) simulations and experimental measurements in both liquid and vapor phases. The simulations are conducted using force fields proposed in the literature for R32 and R125. The simulated results are initially validated against data from the literature for the liquid phase, with deviations below 0.35% and 5.41% for density and the dielectric constant, respectively. To expand the analysis, experimental measurements of the dielectric constant are performed for both liquid and vapor phases under controlled pressure and temperature conditions. The MD simulations performed under the same conditions reproduce the experimental data, with deviations of 2.72% for the liquid phase and 7.83% for the vapor phase. These results support the use of the selected force fields and expand the available dielectric constant data for R410A, providing a basis for evaluating and characterizing other refrigerants with similar electrical properties, including potential low-GWP alternatives.