A Steel Defect Detection Model Enhanced by Pinwheel-Shaped Convolution and Pyramid Sparse Transformer
Steel surface defect detection is critical for ensuring industrial product quality and safety. Although deep learning-based detectors like the YOLO series have demonstrated considerable promise, they often struggle with three key challenges under computational constraints: the anisotropic morphology (i.e., direction-variant shapes) of defects, insufficient modeling of long-range dependencies, and the confusion between signal and noise in feature representation. To address these issues, this paper proposes PSC-YOLO, an enhanced model based on YOLOv11n. Our core design philosophy leverages symmetry principles to guide feature representation and fusion. First, we introduce Pinwheel-shaped Convolution (PConv), whose set of rotationally symmetric kernels explicitly captures multi-directional features to effectively represent anisotropic defects. Second, a Pyramid Sparse Transformer (PST) module is integrated to capture global context via its efficient cross-scale sparse attention, which reduces computational complexity by dynamically focusing on the most relevant features across different scales, leveraging a symmetrical pyramid architecture for balanced multi-scale fusion, thereby overcoming the bottleneck in long-range dependency modeling. Finally, a Channel-Prior Convolutional Attention (CPCA) mechanism is embedded to perform dynamic feature recalibration, which leverages internal structural symmetry—through symmetric pooling pathways and parallel multi-scale convolutions—to suppress background noise and highlight salient defects. Comprehensive experiments on the public NEU-DET dataset show that PSC-YOLO achieves superior performance, obtaining a [email protected] of 78.3% and a [email protected]:0.95 of 48.3%, while maintaining a real-time inference speed of 2.8 ms per image. This demonstrates the model’s strong potential for deployment on industrial production lines, enabling high-precision, real-time quality inspection.
Authors
- Gui Yu (ORCID: https://orcid.org/0000-0003-1564-2623)
- Miao Chen (ORCID: https://orcid.org/0009-0000-3989-3983)
- Chao Wu (ORCID: https://orcid.org/0000-0003-2274-4097)
- Shuangxi Gao
- X. Guo (ORCID: https://orcid.org/0000-0002-6448-0002)
Institutions
- Huanggang Normal University (CN)
Publication Details
- Journal
- Symmetry
- Published
- 2025-12-04
- DOI
- https://doi.org/10.3390/sym17122085
- Primary Topic
- Industrial Vision Systems and Defect Detection
- Type
- article
- Field-Weighted Citation Impact
- 0.00