Subtle details revealed via powder diffraction and validated by charge flipping
Lake and Von Dreele [Acta Cryst. (2025), B81, 572-581] provide an informative look at the current state of the art in powder diffraction, and subtleties that can be revealed through its careful application.
Authors
- Peter W. Stephens (ORCID: https://orcid.org/0000-0002-8311-7305)
Institutions
- Stony Brook University (US)
Publication Details
- Journal
- Acta Crystallographica Section B Structural Science Crystal Engineering and Materials
- Published
- 2025-12-01
- DOI
- https://doi.org/10.1107/s2052520625010601
- Primary Topic
- X-ray Diffraction in Crystallography
- Type
- article
- Field-Weighted Citation Impact
- 0.00