BiGRMT: Bidirectional GRU–Recurrent Memory Transformer for Efficient Long-Sequence Anomaly Detection in High-Concurrency Microservices
In high-concurrency distributed systems, log data often exhibits sequence uncertainty and redundancy, which pose significant challenges to the accuracy and efficiency of anomaly detection. To address these issues, we propose BiGRMT, a hybrid architecture that integrates Bidirectional Gated Recurrent Unit (Bi-GRU) with a Recurrent Memory Transformer (RMT). BiGRMT enhances local temporal feature extraction through bidirectional modeling and adaptive noise filtering using Bi-GRU, while a RMT component is incorporated to significantly extend the model’s capacity for long-sequence modeling via segment-level memory. The Transformer’s multi-head attention mechanism continues to capture global time dependencies but now with improved efficiency due to the RMT’s memory-sharing design. Extensive experiments on three benchmark datasets from LogHub (Spark, BGL(Blue Gene/L), and HDFS (Hadoop distributed file system)) demonstrate that BiGRMT achieves strong results in terms of precision, recall, and F1-score. It attains a precision of 0.913, outperforming LogGPT (0.487) and slightly exceeding Temporal logical attention network (TLAN) (0.912). Compared to LogPal, which prioritizes detection accuracy, BiGRMT strikes a better balance by significantly reducing computational overhead while maintaining high detection performance. Even under challenging conditions such as a 50% increase in log generation rate or 20% injected noise, BiGRMT maintains F1-scores of 87.4% and 83.6%, respectively, showcasing excellent robustness. These findings confirm that BiGRMT is a scalable and practical solution for automated fault detection and intelligent maintenance in complex distributed software systems.
Authors
- Xiaoming Hu (ORCID: https://orcid.org/0000-0003-0177-1993)
- Kun‐Lin Yang (ORCID: https://orcid.org/0000-0002-7958-9334)
- Dandi Qiao (ORCID: https://orcid.org/0000-0001-9450-205X)
- R Zhang
- Shuyuan Wang (ORCID: https://orcid.org/0000-0002-8892-2266)
- Miao Xu (ORCID: https://orcid.org/0000-0001-9684-0642)
- R. Zhang (ORCID: https://orcid.org/0000-0002-8265-474X)
Institutions
- Shanghai Electric (China) (CN)
Publication Details
- Journal
- Electronics
- Published
- 2025-12-03
- DOI
- https://doi.org/10.3390/electronics14234754
- Primary Topic
- Software System Performance and Reliability
- Type
- article
- Field-Weighted Citation Impact
- 0.00