Line projection profilometry
Fringe Projection Profilometry (FPP) is widely used in 3D reconstruction tasks due to its advantages of high accuracy, high data density, and non-contact operation. However, in practical industrial inspections, measurements for high-dynamic range scenarios often suffer from local overexposure or underexposure in captured fringe images, severely reducing measurement reliability and integrity. To solve these technical bottlenecks, this study proposes Line Projection Profilometry (LPP). It adopts a binary line-shifting encoding method to calculate the phase by introducing sinusoidal signal modulation. The process of generating fringes via line synthesis indirectly expands the dynamic range of the camera, thus achieving better reconstruction performance. Test results demonstrate that LPP performs better than FPP, which has a great application potential in complex industrial scenarios.
Authors
- Xiaoli Liu (ORCID: https://orcid.org/0000-0002-6204-4485)
- Qijian Tang (ORCID: https://orcid.org/0000-0002-8862-7646)
- Yanfei Li (ORCID: https://orcid.org/0000-0003-3464-6806)
Institutions
- Shenzhen University (CN)
Publication Details
- Journal
- Optics Letters
- Published
- 2025-12-03
- DOI
- https://doi.org/10.1364/ol.583953
- Primary Topic
- Optical measurement and interference techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00