A Method to Obtain the Characteristics of Surface-Mounted Devices Based on Single Port Measurements Using Minimal Fixtures

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Publication Details

Journal
Journal of The Japan Institute of Electronics Packaging
Published
2025-12-02
DOI
https://doi.org/10.5104/jiep.jiep-d-25-00076
Primary Topic
Microwave and Dielectric Measurement Techniques
Type
article
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article

A Method to Obtain the Characteristics of Surface-Mounted Devices Based on Single Port Measurements Using Minimal Fixtures

Koji Wada, Junya Matsuki, Hiroyuki Matsuura, Akehito Shiotake
Journal of The Japan Institute of Electronics Packaging
Microwave and Dielectric Measurement Techniques
article

A Method to Obtain the Characteristics of Surface-Mounted Devices Based on Single Port Measurements Using Minimal Fixtures

Koji Wada, Junya Matsuki, Hiroyuki Matsuura, Akehito Shiotake
article en

Abstract

No abstract available for this paper.
Journal of The Japan Institute of Electronics PackagingVol. 29(1)
University of Electro-Communications (JP)
Openalex Percentile: Top 62%
Microwave and Dielectric Measurement Techniques
DOISourceOpenAlex
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