Dual-Mode Diagnostics of Thick-Film Strain Sensors for Structural Health Monitoring Under High-Voltage Surge Stress

This paper investigates the impact of high-voltage surges on the performance of thick-film strain sensors applied in structural health monitoring (SHM). The sensors, fabricated from bismuth-lead ruthenate resistive films on alumina substrates, were subjected to mechanical strain and controlled surge pulses to replicate real-world electrical stress conditions. Experimental results show that while resistance measurements alone provide limited insight, the combination of resistance and noise analysis reveals underlying degradation mechanisms. These findings highlight the robustness of thick-film strain sensors and support their suitability for SHM applications in electrically demanding environments.