Positive electron beam resists for lithography below 5 nm

We compare two promising new positive self-developing electron beam resists that enable the direct patterning of nanostructures at the 1–5 nm scale. Myo-inositol is a positive organic resist that can be exposed to provide line and dot gratings with 8 nm pitch at a dose of 6 nC/cm. YbF2 provides better resolution in thick films as it is mechanically stronger, and we show line and dot gratings with 5 nm pitch at a dose of 80 nC/cm. Both of these resists were deposited by vapor deposition, and their exposure conditions were compared by exposing and imaging resist patterns in a scanning transmission electron microscope with a 0.2 nm spot size at 40–160 kV. 5 nm feature sizes were demonstrated in 90–100 nm thick layers of both materials.

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Publication Details

Journal
Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena
Published
2025-12-01
DOI
https://doi.org/10.1116/6.0004949
Primary Topic
Advancements in Photolithography Techniques
Type
article
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article

Positive electron beam resists for lithography below 5 nm

Axel Scherer, Richard D. Smith
Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena
Advancements in Photolithography Techniques
article

Positive electron beam resists for lithography below 5 nm

Axel Scherer, Richard D. Smith
article en

Abstract

We compare two promising new positive self-developing electron beam resists that enable the direct patterning of nanostructures at the 1–5 nm scale. Myo-inositol is a positive organic resist that can be exposed to provide line and dot gratings with 8 nm pitch at a dose of 6 nC/cm. YbF2 provides better resolution in thick films as it is mechanically stronger, and we show line and dot gratings with 5 nm pitch at a dose of 80 nC/cm. Both of these resists were deposited by vapor deposition, and their exposure conditions were compared by exposing and imaging resist patterns in a scanning transmission electron microscope with a 0.2 nm spot size at 40–160 kV. 5 nm feature sizes were demonstrated in 90–100 nm thick layers of both materials.

Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and PhenomenaVol. 43(6)
California Institute of Technology (US), Kavli Energy NanoScience Institute (US)
Openalex Percentile: Top 63%
Advancements in Photolithography Techniques
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