Positive electron beam resists for lithography below 5 nm
We compare two promising new positive self-developing electron beam resists that enable the direct patterning of nanostructures at the 1–5 nm scale. Myo-inositol is a positive organic resist that can be exposed to provide line and dot gratings with 8 nm pitch at a dose of 6 nC/cm. YbF2 provides better resolution in thick films as it is mechanically stronger, and we show line and dot gratings with 5 nm pitch at a dose of 80 nC/cm. Both of these resists were deposited by vapor deposition, and their exposure conditions were compared by exposing and imaging resist patterns in a scanning transmission electron microscope with a 0.2 nm spot size at 40–160 kV. 5 nm feature sizes were demonstrated in 90–100 nm thick layers of both materials.
Authors
- Axel Scherer (ORCID: https://orcid.org/0000-0002-2160-9064)
- Richard D. Smith (ORCID: https://orcid.org/0000-0001-9384-105X)
Institutions
- California Institute of Technology (US)
- Kavli Energy NanoScience Institute (US)
Publication Details
- Journal
- Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena
- Published
- 2025-12-01
- DOI
- https://doi.org/10.1116/6.0004949
- Primary Topic
- Advancements in Photolithography Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00